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Hãng sản xuất: Kruss

Analyzing wetting and material deformation at up to 2000 °C

The DSAHT Drop Shape Analyzer goes to the extreme when it comes to wetting and deformation analysis of melts and combustion residues. With temperatures up to 2000 °C in a various range of atmospheric conditions, the instrument analyzes melting substances and helps to understand the interactions that occur when melts come into contact with solid material. This knowledge supports you in optimizing combustion, firing, or coating processes in order to create stable end products, save energy during the process, or prolong the service life of your furnaces.

 

HỖ TRỢ NHANH

THÔNG TIN SẢN PHẨM

INSTRUMENT DIMENSIONS

Footprint 120 × 40 cm
Height 40 cm

TEMPERATURE MEASUREMENT

Accuracy ± 2.5 °C
Location of temperature measurement at the sample

POWER SUPPLY

Voltage 230 V / 16A

SAMPLE DIMENSIONS

Maximum sample size length: 20 mm, diameter: 7 mm

TEMPERATURE CONTROL

Cooling rates > 1100 °C: 20 °C/min
1100 … 600 °C: 10 °C/min
600 … 300 °C: 5 °C/min

SOFTWARE

Software type ADVANCE & heating microscope
Available software modules contact angle

SESSILE DROP

Results contact angle
Range 0 to 180°
Resolution 0.01°
Models conic section
polynom
circle
Young-Laplace
height-width
Type advancing
static
dynamic

CAMERA SYSTEM (STANDARD)

Connection ethernet

ILLUMINATION

Type halogen, telecentric
Field of light 25 × 23 mm (D × H)

OPTICS (STANDARD)

Focus software controlled autofocus
Field of view 10 × 14 mm
Resolution of optics down to 7μm

OPTICS

Lens magnification 1.87
  • Measuring adhesion and wetting of metal slags in smelting plants
  • Detecting reactions between the glass and refractory bricks in glass production
  • Optimizing wetting of the carrier material by enamel coatings
  • Investigating the changes of the green body depending on temperature and time in ceramics production

Contact angle of a drop on a solid surface

  • Contact angle
  • Surface tension (calculated from the curvature of a sessile drop)
  • Temperature in close vicinity to the sample