Mô tả ngắn

Hãng sản xuất: Kruss

Automatic wettability and adhesion analysis of wafers and other round samples

The Wafer configuration of the DSA100 Drop Shape Analyzer is geared towards the automatic, standardized quality control of wafer surfaces and other round samples. The instrument precisely determines the homogeneity of the cleaning of a surface based on the contact angle. It also enables coatings to be characterized, for example by differences in wetting of exposed and unexposed photo varnish.

HỖ TRỢ NHANH

THÔNG TIN SẢN PHẨM

INSTRUMENT DIMENSIONS

Footprint 555 mm × 375 mm (W × D)
Height 490 mm
Weight (without accessories) 24 kg

TEMPERATURE MEASUREMENT

Range of temperature measurement -50 to 400 °C
Resolution 0.1 °C
Precision 0.1 °C
Accuracy 1/3 DIN B (±0.1 °C at 0 °C to ±0.8 °C at 400 °C)
Location of temperature measurement environment air
External sensor 2 connectors (PT100)

POWER SUPPLY

Voltage 88 to 264 VAC
Power consumption 100 W
Frequency 50 to 60 Hz

SAMPLE DIMENSIONS

Maximum sample size 320 mm × ∞ × 275 mm (W × D × H) (without axes)
Maximum measuring surface

ENVIRONMENT

Operating temperature 10 to 40 °C
Humidity without condensation

TEMPERATURE CONTROL

Equipment
Type of temperature control
Range of temperature control
Maximum sample space
Resolution
Flow-through thermostat
Inert gas

INTERFACES

PC USB 3.0

HOUSING AND PERIPHERALS

Compartment test liquids protected against light
Needle protection shield yes
Camera und optics housing yes
Control keyboard PC keyboard for ADVANCE software operation available (KB20)
Levelling yes

SOFTWARE

Software type ADVANCE
Available software modules contact angle
surface free energy of solids
interfacial and surface tension of liquids
Adhesion Analysis
Remote Control API

SURFACE FREE ENERGY OF SOLIDS

Available included
Results surface free energy (SFE)
Models equation of state
Zisman
Fowkes
Wu
Owens-Wendt-Rabel-Kaelble
extended Fowkes
acid-base theory

CAPTIVE BUBBLE

Available included
Results contact angle (CA)
Range 0 to 180° (software-based)
Resolution 0.01° (software-based)
Accuracy 0.1° (instrument-based)
Models conic section
polynom
circle
Young-Laplace
height-width
Type advancing
receding
static
dynamic
tilting
(additional accessories may be required)

SESSILE DROP

Available included
Results contact angle (CA)
Range 0 to 180° (software-based)
Resolution 0.01° (software-based)
Accuracy 0.1° (instrument-based)
Models conic section
polynom
circle
Young-Laplace
height-width
Type advancing
receding
static
dynamic
tilting
(additional accessories may be required)

PENDANT DROP/RISING DROP

Available included
Results interfacial tension (IFT)/surface tension (SFT)
Range 0.01 to 2000 mN/m (software-based)
Resolution 0.01 mN/m (software-based)
Models Young-Laplace
Types (Pendant drop/Rising drop) static, dynamic

CAMERA SYSTEM (STANDARD)

Type Camera CF04
Connection USB 3.0
Resolution 1920 × 1200 px
Frame rate 2300 fps
Dark noise 7 electrons
Dynamic range 73 dB

ILLUMINATION

Type high power monochromatic LED
Wave length, dominant 470 nm
Field of light 46 mm × 46 mm (D × H)

OPTICS (STANDARD)

Focus manual
Zoom 7× zoom, manual
View angle ±4°
Field of view CF04: 3.9 mm × 3.9 mm to 24.7 mm × 24.7 mm
Resolution of optics CF04: 3.1 to 21.7 μm

CAMERA SYSTEM (OPTIONAL)

Type High Speed Camera CF06
Connection USB 3.0
Resolution 640 × 480 px
Frame rate 3400 fps
Dark noise 10.5 electrons
Dynamic range 56.6 dB

DOSING SYSTEM

Dosing software-controlled
Drop deposition software-controlled
Cartridge/syringe (volume) glass (450 μL), disposable (900 μL)
Resolution 0.1 μL
Speed 0.02 to 25 µL/s

STAGES

Control y-axis: software-controlled
z-axis: manual
z-axis (optional): software-controlled
rotation axis: software-controlled
Range y-axis: 170 mm
z-axis manual: 45 mm
z-axis software-controlled (optional): 38 mm
rotation axis: 360°
Length
Resolution y-axis: 10 μm
z-axis manual: 16 mm/turn
z-axis software-controlled (optional): 10 μm
rotation axis: 0.1°
Accuracy y-axis: 100 μm
z-axis manual: –
z-axis software-controlled (optional): 100 μm
rotation axis: 1°

OPTICS (OPTIONAL)

Focus manual
Zoom 7× zoom, manual
View angle ±4°
Field of view CF06: 1.7 mm × 1.3 mm to 10.8 mm × 8.1 mm
Resolution of optics CF06: 2.5 to 17.8 μm

DOUBLE PRESSURE DOSING SYSTEM (OPTIONAL)

Drop deposition software-controlled
Cartridge, volume disposable (1 mL)
Resolution 0.1 μL
Speed fixed

TILTING (OPTIONAL)

Types external tilting table
Control software-controlled
Range 0 to 90°
Resolution 0.1°
Accuracy

DOUBLE PRESSURE DOSING SYSTEM

Drop deposition
Cartridge, volume
Resolution
Speed
  • Characterization of the cleaning and coating homogeneity of wafers
  • Adhesion evaluation between wafer and coating
  • Wetting investigation of exposed and unexposed photo varnish
  • Ideal for analyzing other round samples, e.g. hard drives or brake disks
  • Contact angle of a drop on a solid surface
  • Contact angles of two drops dosed in parallel
  • Automated position-dependent contact angle measurement and evaluation
  • Contact angle using a gas bubble beneath a solid surface in a liquid
  • Surface free energy of a solid using contact angle data
  • Surface tension using the curvature of a perfectly symmetrical drop on a circular sample pedestal
  • Roll-off behavior and advancing/receding contact angle of a drop on a tilted surface
  • Carrying out a measurement up to 20 consecutive times and displaying the results together
  • Remote control of ADVANCE for integration in custom-designed, complex automations
  • Static contact angle
  • Advancing and receding contact angle
  • Contact angle using a bubble in a liquid
  • Surface free energy (SFE) according to the following models: Owens-Wendt-Rabel-Kaelble (OWRK), Fowkes, Extended Fowkes, Van Oss & Good (Acid-Base), Schultz, Wu, Zisman, Equation of State
  • Position-dependent contact angle and SFE
  • Temperature